Carrier-specific dynamics in 2H-MoTe(2) observed by femtosecond soft x-ray absorption spectroscopy using an x-ray free-electron laser

Femtosecond carrier dynamics in layered 2H-MoTe(2) semiconductor crystals have been investigated using soft x-ray transient absorption spectroscopy at the x-ray free-electron laser (XFEL) of the Pohang Accelerator Laboratory. Following above-bandgap optical excitation of 2H-MoTe(2), the photoexcited...

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Detalles Bibliográficos
Autores principales: Britz, Alexander, Attar, Andrew R., Zhang, Xiang, Chang, Hung-Tzu, Nyby, Clara, Krishnamoorthy, Aravind, Park, Sang Han, Kwon, Soonnam, Kim, Minseok, Nordlund, Dennis, Sainio, Sami, Heinz, Tony F., Leone, Stephen R., Lindenberg, Aaron M., Nakano, Aiichiro, Ajayan, Pulickel, Vashishta, Priya, Fritz, David, Lin, Ming-Fu, Bergmann, Uwe
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2021
Materias:
Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7808761/
https://www.ncbi.nlm.nih.gov/pubmed/33511247
http://dx.doi.org/10.1063/4.0000048

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7808761/
https://www.ncbi.nlm.nih.gov/pubmed/33511247
http://dx.doi.org/10.1063/4.0000048

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