Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy

Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission e...

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Detalles Bibliográficos
Autores principales: Chang, Yun-Yeong, Han, Heung Nam, Kim, Miyoung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Singapore 2019
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7809582/
https://www.ncbi.nlm.nih.gov/pubmed/33580317
http://dx.doi.org/10.1186/s42649-019-0013-5
_version_ 1783637148155510784
author Chang, Yun-Yeong
Han, Heung Nam
Kim, Miyoung
author_facet Chang, Yun-Yeong
Han, Heung Nam
Kim, Miyoung
author_sort Chang, Yun-Yeong
collection PubMed
description Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.
format Online
Article
Text
id pubmed-7809582
institution National Center for Biotechnology Information
language English
publishDate 2019
publisher Springer Singapore
record_format MEDLINE/PubMed
spelling pubmed-78095822021-02-10 Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy Chang, Yun-Yeong Han, Heung Nam Kim, Miyoung Appl Microsc Review Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy. Springer Singapore 2019-11-04 /pmc/articles/PMC7809582/ /pubmed/33580317 http://dx.doi.org/10.1186/s42649-019-0013-5 Text en © The Author(s) 2019 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
spellingShingle Review
Chang, Yun-Yeong
Han, Heung Nam
Kim, Miyoung
Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
title Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
title_full Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
title_fullStr Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
title_full_unstemmed Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
title_short Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
title_sort analyzing the microstructure and related properties of 2d materials by transmission electron microscopy
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7809582/
https://www.ncbi.nlm.nih.gov/pubmed/33580317
http://dx.doi.org/10.1186/s42649-019-0013-5
work_keys_str_mv AT changyunyeong analyzingthemicrostructureandrelatedpropertiesof2dmaterialsbytransmissionelectronmicroscopy
AT hanheungnam analyzingthemicrostructureandrelatedpropertiesof2dmaterialsbytransmissionelectronmicroscopy
AT kimmiyoung analyzingthemicrostructureandrelatedpropertiesof2dmaterialsbytransmissionelectronmicroscopy

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