Cargando…

Patch‐wise brain age longitudinal reliability

We recently introduced a patch‐wise technique to estimate brain age from anatomical T1‐weighted magnetic resonance imaging (T1w MRI) data. Here, we sought to assess its longitudinal reliability by leveraging a unique dataset of 99 longitudinal MRI scans from a single, cognitively healthy volunteer a...

Descripción completa

Detalles Bibliográficos
Autores principales: Beheshti, Iman, Potvin, Olivier, Duchesne, Simon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley & Sons, Inc. 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7814761/
https://www.ncbi.nlm.nih.gov/pubmed/33205863
http://dx.doi.org/10.1002/hbm.25253
_version_ 1783638119995670528
author Beheshti, Iman
Potvin, Olivier
Duchesne, Simon
author_facet Beheshti, Iman
Potvin, Olivier
Duchesne, Simon
author_sort Beheshti, Iman
collection PubMed
description We recently introduced a patch‐wise technique to estimate brain age from anatomical T1‐weighted magnetic resonance imaging (T1w MRI) data. Here, we sought to assess its longitudinal reliability by leveraging a unique dataset of 99 longitudinal MRI scans from a single, cognitively healthy volunteer acquired over a period of 17 years (aged 29–46 years) at multiple sites. We built a robust patch‐wise brain age estimation framework on the basis of 100 cognitively healthy individuals from the MindBoggle dataset (aged 19–61 years) using the Desikan‐Killiany‐Tourville atlas, then applied the model to the volunteer dataset. The results show a high prediction accuracy on the independent test set (R(2) = .94, mean absolute error of 0.63 years) and no statistically significant difference between manufacturers, suggesting that the patch‐wise technique has high reliability and can be used for longitudinal multi‐centric studies.
format Online
Article
Text
id pubmed-7814761
institution National Center for Biotechnology Information
language English
publishDate 2020
publisher John Wiley & Sons, Inc.
record_format MEDLINE/PubMed
spelling pubmed-78147612021-01-26 Patch‐wise brain age longitudinal reliability Beheshti, Iman Potvin, Olivier Duchesne, Simon Hum Brain Mapp Research Articles We recently introduced a patch‐wise technique to estimate brain age from anatomical T1‐weighted magnetic resonance imaging (T1w MRI) data. Here, we sought to assess its longitudinal reliability by leveraging a unique dataset of 99 longitudinal MRI scans from a single, cognitively healthy volunteer acquired over a period of 17 years (aged 29–46 years) at multiple sites. We built a robust patch‐wise brain age estimation framework on the basis of 100 cognitively healthy individuals from the MindBoggle dataset (aged 19–61 years) using the Desikan‐Killiany‐Tourville atlas, then applied the model to the volunteer dataset. The results show a high prediction accuracy on the independent test set (R(2) = .94, mean absolute error of 0.63 years) and no statistically significant difference between manufacturers, suggesting that the patch‐wise technique has high reliability and can be used for longitudinal multi‐centric studies. John Wiley & Sons, Inc. 2020-11-18 /pmc/articles/PMC7814761/ /pubmed/33205863 http://dx.doi.org/10.1002/hbm.25253 Text en © 2020 The Authors. Human Brain Mapping published by Wiley Periodicals LLC. This is an open access article under the terms of the http://creativecommons.org/licenses/by/4.0/ License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
spellingShingle Research Articles
Beheshti, Iman
Potvin, Olivier
Duchesne, Simon
Patch‐wise brain age longitudinal reliability
title Patch‐wise brain age longitudinal reliability
title_full Patch‐wise brain age longitudinal reliability
title_fullStr Patch‐wise brain age longitudinal reliability
title_full_unstemmed Patch‐wise brain age longitudinal reliability
title_short Patch‐wise brain age longitudinal reliability
title_sort patch‐wise brain age longitudinal reliability
topic Research Articles
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7814761/
https://www.ncbi.nlm.nih.gov/pubmed/33205863
http://dx.doi.org/10.1002/hbm.25253
work_keys_str_mv AT beheshtiiman patchwisebrainagelongitudinalreliability
AT potvinolivier patchwisebrainagelongitudinalreliability
AT duchesnesimon patchwisebrainagelongitudinalreliability