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Double staining method for array tomography using scanning electron microscopy
Scanning electron microscopy (SEM) plays a central role in analyzing structures by imaging a large area of brain tissue at nanometer scales. A vast amount of data in the large area are required to study structural changes of cellular organelles in a specific cell, such as neurons, astrocytes, oligod...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer Singapore
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7818292/ https://www.ncbi.nlm.nih.gov/pubmed/33580409 http://dx.doi.org/10.1186/s42649-020-00033-8 |
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author | Kim, Eunjin Lee, Jiyoung Noh, Seulgi Kwon, Ohkyung Mun, Ji Young |
author_facet | Kim, Eunjin Lee, Jiyoung Noh, Seulgi Kwon, Ohkyung Mun, Ji Young |
author_sort | Kim, Eunjin |
collection | PubMed |
description | Scanning electron microscopy (SEM) plays a central role in analyzing structures by imaging a large area of brain tissue at nanometer scales. A vast amount of data in the large area are required to study structural changes of cellular organelles in a specific cell, such as neurons, astrocytes, oligodendrocytes, and microglia among brain tissue, at sufficient resolution. Array tomography is a useful method for large-area imaging, and the osmium-thiocarbohydrazide-osmium (OTO) and ferrocyanide-reduced osmium methods are commonly used to enhance membrane contrast. Because many samples prepared using the conventional technique without en bloc staining are considered inadequate for array tomography, we suggested an alternative technique using post-staining conventional samples and compared the advantages. |
format | Online Article Text |
id | pubmed-7818292 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Springer Singapore |
record_format | MEDLINE/PubMed |
spelling | pubmed-78182922021-02-10 Double staining method for array tomography using scanning electron microscopy Kim, Eunjin Lee, Jiyoung Noh, Seulgi Kwon, Ohkyung Mun, Ji Young Appl Microsc Technical Report Scanning electron microscopy (SEM) plays a central role in analyzing structures by imaging a large area of brain tissue at nanometer scales. A vast amount of data in the large area are required to study structural changes of cellular organelles in a specific cell, such as neurons, astrocytes, oligodendrocytes, and microglia among brain tissue, at sufficient resolution. Array tomography is a useful method for large-area imaging, and the osmium-thiocarbohydrazide-osmium (OTO) and ferrocyanide-reduced osmium methods are commonly used to enhance membrane contrast. Because many samples prepared using the conventional technique without en bloc staining are considered inadequate for array tomography, we suggested an alternative technique using post-staining conventional samples and compared the advantages. Springer Singapore 2020-06-22 /pmc/articles/PMC7818292/ /pubmed/33580409 http://dx.doi.org/10.1186/s42649-020-00033-8 Text en © The Author(s) 2020 Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Technical Report Kim, Eunjin Lee, Jiyoung Noh, Seulgi Kwon, Ohkyung Mun, Ji Young Double staining method for array tomography using scanning electron microscopy |
title | Double staining method for array tomography using scanning electron microscopy |
title_full | Double staining method for array tomography using scanning electron microscopy |
title_fullStr | Double staining method for array tomography using scanning electron microscopy |
title_full_unstemmed | Double staining method for array tomography using scanning electron microscopy |
title_short | Double staining method for array tomography using scanning electron microscopy |
title_sort | double staining method for array tomography using scanning electron microscopy |
topic | Technical Report |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7818292/ https://www.ncbi.nlm.nih.gov/pubmed/33580409 http://dx.doi.org/10.1186/s42649-020-00033-8 |
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