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Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest compone...

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Detalles Bibliográficos
Autores principales:	Otieno, Luke Oduor, Alunda, Bernard Ouma, Kim, Jaehyun, Lee, Yong Joong
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2021
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7825750/ https://www.ncbi.nlm.nih.gov/pubmed/33430315 http://dx.doi.org/10.3390/s21020362

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