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Predictive Model of Nail Consistency Using Scanning Electron Microscopy with Energy-Dispersive X-Ray

SIMPLE SUMMARY: Scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM-EDS) is a useful technique to analyse elemental composition in the nail plate. The dorsal, intermediate, and ventral layers are differentiated by the levels of the elements present in each layer. The level of...

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Detalles Bibliográficos
Autores principales:	Mingorance Álvarez, Esther, Martínez Quintana, Rodrigo, Pérez Pico, Ana Mª, Mayordomo, Raquel
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2021
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7828269/ https://www.ncbi.nlm.nih.gov/pubmed/33445794 http://dx.doi.org/10.3390/biology10010053

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