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Method for assessing the spatiotemporal resolution of structured illumination microscopy (SIM)

A method is proposed for assessing the temporal resolution of structured illumination microscopy (SIM), by tracking the amplitude of different spatial frequency components over time, and comparing them to a temporally-oscillating ground-truth. This method is used to gain insight into the performance...

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Detalles Bibliográficos
Autores principales:	Boualam, Abderrahim, Rowlands, Christopher J.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Optical Society of America 2021
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7901338/ https://www.ncbi.nlm.nih.gov/pubmed/33680542 http://dx.doi.org/10.1364/BOE.403592

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