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Characterization and fine mapping of a new dwarf mutant in Brassica napus

BACKGROUND: Plant height is an important plant characteristic closely related to yield performance of many crops. Reasonable reduction of plant height of crops is beneficial for improving yield and enhancing lodging resistance. RESULTS: In the present study, we described the Brassica napus dwarf mut...

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Detalles Bibliográficos
Autores principales: Li, Xin, Xiang, Fujiang, Zhang, Wei, Yan, Jindong, Li, Xinmei, Zhong, Ming, Yang, Piao, Chen, Caiyan, Liu, Xuanming, Mao, Donghai, Zhao, Xiaoying
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7908660/
https://www.ncbi.nlm.nih.gov/pubmed/33637037
http://dx.doi.org/10.1186/s12870-021-02885-y

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