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Enhancing Reliability of Studies on Single Filament Memristive Switching via an Unconventional cAFM Approach
Memristive devices are highly promising for implementing neuromorphic functionalities in future electronic hardware, and direct insights into memristive phenomena on the nanoscale are of fundamental importance to reaching this. Conductive atomic force microscopy (cAFM) has proven to be an essential...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7909531/ https://www.ncbi.nlm.nih.gov/pubmed/33498494 http://dx.doi.org/10.3390/nano11020265 |