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Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level

The design of innovative reference aspheric and freeform optical elements was investigated with the aim of calibration and verification of ultra-high accurate measurement systems. The verification is dedicated to form error analysis of aspherical and freeform optical surfaces based on minimum zone f...

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Autores principales: Arezki, Yassir, Su, Rong, Heikkinen, Ville, Leprete, François, Posta, Pavel, Bitou, Youichi, Schober, Christian, Mehdi-Souzani, Charyar, Alzahrani, Bandar Abdulrahman Mohammed, Zhang, Xiangchao, Kondo, Yohan, Pruss, Christof, Ledl, Vit, Anwer, Nabil, Bouazizi, Mohamed Lamjed, Leach, Richard, Nouira, Hichem
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7915810/
https://www.ncbi.nlm.nih.gov/pubmed/33562598
http://dx.doi.org/10.3390/s21041103
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author Arezki, Yassir
Su, Rong
Heikkinen, Ville
Leprete, François
Posta, Pavel
Bitou, Youichi
Schober, Christian
Mehdi-Souzani, Charyar
Alzahrani, Bandar Abdulrahman Mohammed
Zhang, Xiangchao
Kondo, Yohan
Pruss, Christof
Ledl, Vit
Anwer, Nabil
Bouazizi, Mohamed Lamjed
Leach, Richard
Nouira, Hichem
author_facet Arezki, Yassir
Su, Rong
Heikkinen, Ville
Leprete, François
Posta, Pavel
Bitou, Youichi
Schober, Christian
Mehdi-Souzani, Charyar
Alzahrani, Bandar Abdulrahman Mohammed
Zhang, Xiangchao
Kondo, Yohan
Pruss, Christof
Ledl, Vit
Anwer, Nabil
Bouazizi, Mohamed Lamjed
Leach, Richard
Nouira, Hichem
author_sort Arezki, Yassir
collection PubMed
description The design of innovative reference aspheric and freeform optical elements was investigated with the aim of calibration and verification of ultra-high accurate measurement systems. The verification is dedicated to form error analysis of aspherical and freeform optical surfaces based on minimum zone fitting. Two thermo-invariant material measures were designed, manufactured using a magnetorheological finishing process and selected for the evaluation of a number of ultra-high-precision measurement machines. All collected data sets were analysed using the implemented robust reference minimum zone (Hybrid Trust Region) fitting algorithm to extract the values of form error. Agreement among the results of several partners was observed, which demonstrates the establishment of a traceable reference full metrology chain for aspherical and freeform optical surfaces with small amplitudes.
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spelling pubmed-79158102021-03-01 Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level Arezki, Yassir Su, Rong Heikkinen, Ville Leprete, François Posta, Pavel Bitou, Youichi Schober, Christian Mehdi-Souzani, Charyar Alzahrani, Bandar Abdulrahman Mohammed Zhang, Xiangchao Kondo, Yohan Pruss, Christof Ledl, Vit Anwer, Nabil Bouazizi, Mohamed Lamjed Leach, Richard Nouira, Hichem Sensors (Basel) Article The design of innovative reference aspheric and freeform optical elements was investigated with the aim of calibration and verification of ultra-high accurate measurement systems. The verification is dedicated to form error analysis of aspherical and freeform optical surfaces based on minimum zone fitting. Two thermo-invariant material measures were designed, manufactured using a magnetorheological finishing process and selected for the evaluation of a number of ultra-high-precision measurement machines. All collected data sets were analysed using the implemented robust reference minimum zone (Hybrid Trust Region) fitting algorithm to extract the values of form error. Agreement among the results of several partners was observed, which demonstrates the establishment of a traceable reference full metrology chain for aspherical and freeform optical surfaces with small amplitudes. MDPI 2021-02-05 /pmc/articles/PMC7915810/ /pubmed/33562598 http://dx.doi.org/10.3390/s21041103 Text en © 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Arezki, Yassir
Su, Rong
Heikkinen, Ville
Leprete, François
Posta, Pavel
Bitou, Youichi
Schober, Christian
Mehdi-Souzani, Charyar
Alzahrani, Bandar Abdulrahman Mohammed
Zhang, Xiangchao
Kondo, Yohan
Pruss, Christof
Ledl, Vit
Anwer, Nabil
Bouazizi, Mohamed Lamjed
Leach, Richard
Nouira, Hichem
Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
title Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
title_full Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
title_fullStr Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
title_full_unstemmed Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
title_short Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level
title_sort traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7915810/
https://www.ncbi.nlm.nih.gov/pubmed/33562598
http://dx.doi.org/10.3390/s21041103
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