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Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter

A kind of low recombination firing-through screen-printing aluminum (Al) paste is proposed in this work to be used for a boron-diffused N-type solar cell front side metallization. A front side fire-through contact (FTC) approach has been carried out for the formation of local contacts for a front su...

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Autores principales: Zhu, Peng, Liu, Yuan, Cao, Chengjiang, Tian, Juan, Zhang, Aichuang, Wang, Deliang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7915839/
https://www.ncbi.nlm.nih.gov/pubmed/33561983
http://dx.doi.org/10.3390/ma14040765
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author Zhu, Peng
Liu, Yuan
Cao, Chengjiang
Tian, Juan
Zhang, Aichuang
Wang, Deliang
author_facet Zhu, Peng
Liu, Yuan
Cao, Chengjiang
Tian, Juan
Zhang, Aichuang
Wang, Deliang
author_sort Zhu, Peng
collection PubMed
description A kind of low recombination firing-through screen-printing aluminum (Al) paste is proposed in this work to be used for a boron-diffused N-type solar cell front side metallization. A front side fire-through contact (FTC) approach has been carried out for the formation of local contacts for a front surface passivated solar cell. With a low contact resistivity (ρ(c)) of 1.0 mΩ·cm(2), good ohmic contact between the boron-doped front surface of the silicon sample and the Al paste was realized. To obtain a good energy conversion efficiency, a balance can be achieved between the open circuit voltage (V(oc)) and contact resistivity (ρ(c)) of the cell by combining suitable Al powders and appropriate additives. The detailed micro-contact difference in Si/metallization between the firing-through Al paste and silver-aluminum (Ag-Al) paste was analyzed. The dark saturation current density beneath the metal contact (J(0, metal)) of the Si/metallization region using our firing-through Al paste was discussed, which was proven to be 61% lower than using Ag-Al paste. The pseudo energy conversion efficiency of the cell using Al paste measured by Suns-V(OC) was also higher than using Ag-Al paste. The role of Al paste in low surface metal recombination is discussed. The utilization of this new kind of Al paste was much cheaper and more convenient, compared to the traditional process using Ag or Ag-Al paste.
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spelling pubmed-79158392021-03-01 Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter Zhu, Peng Liu, Yuan Cao, Chengjiang Tian, Juan Zhang, Aichuang Wang, Deliang Materials (Basel) Article A kind of low recombination firing-through screen-printing aluminum (Al) paste is proposed in this work to be used for a boron-diffused N-type solar cell front side metallization. A front side fire-through contact (FTC) approach has been carried out for the formation of local contacts for a front surface passivated solar cell. With a low contact resistivity (ρ(c)) of 1.0 mΩ·cm(2), good ohmic contact between the boron-doped front surface of the silicon sample and the Al paste was realized. To obtain a good energy conversion efficiency, a balance can be achieved between the open circuit voltage (V(oc)) and contact resistivity (ρ(c)) of the cell by combining suitable Al powders and appropriate additives. The detailed micro-contact difference in Si/metallization between the firing-through Al paste and silver-aluminum (Ag-Al) paste was analyzed. The dark saturation current density beneath the metal contact (J(0, metal)) of the Si/metallization region using our firing-through Al paste was discussed, which was proven to be 61% lower than using Ag-Al paste. The pseudo energy conversion efficiency of the cell using Al paste measured by Suns-V(OC) was also higher than using Ag-Al paste. The role of Al paste in low surface metal recombination is discussed. The utilization of this new kind of Al paste was much cheaper and more convenient, compared to the traditional process using Ag or Ag-Al paste. MDPI 2021-02-06 /pmc/articles/PMC7915839/ /pubmed/33561983 http://dx.doi.org/10.3390/ma14040765 Text en © 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Zhu, Peng
Liu, Yuan
Cao, Chengjiang
Tian, Juan
Zhang, Aichuang
Wang, Deliang
Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter
title Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter
title_full Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter
title_fullStr Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter
title_full_unstemmed Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter
title_short Low Recombination Firing-Through Al Paste for N-Type Solar Cell with Boron Emitter
title_sort low recombination firing-through al paste for n-type solar cell with boron emitter
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7915839/
https://www.ncbi.nlm.nih.gov/pubmed/33561983
http://dx.doi.org/10.3390/ma14040765
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AT tianjuan lowrecombinationfiringthroughalpasteforntypesolarcellwithboronemitter
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