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Nearest labelset using double distances for multi-label classification
Multi-label classification is a type of supervised learning where an instance may belong to multiple labels simultaneously. Predicting each label independently has been criticized for not exploiting any correlation between labels. In this article we propose a novel approach, Nearest Labelset using D...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
PeerJ Inc.
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7924696/ https://www.ncbi.nlm.nih.gov/pubmed/33816895 http://dx.doi.org/10.7717/peerj-cs.242 |
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author | Gweon, Hyukjun Schonlau, Matthias Steiner, Stefan H. |
author_facet | Gweon, Hyukjun Schonlau, Matthias Steiner, Stefan H. |
author_sort | Gweon, Hyukjun |
collection | PubMed |
description | Multi-label classification is a type of supervised learning where an instance may belong to multiple labels simultaneously. Predicting each label independently has been criticized for not exploiting any correlation between labels. In this article we propose a novel approach, Nearest Labelset using Double Distances (NLDD), that predicts the labelset observed in the training data that minimizes a weighted sum of the distances in both the feature space and the label space to the new instance. The weights specify the relative tradeoff between the two distances. The weights are estimated from a binomial regression of the number of misclassified labels as a function of the two distances. Model parameters are estimated by maximum likelihood. NLDD only considers labelsets observed in the training data, thus implicitly taking into account label dependencies. Experiments on benchmark multi-label data sets show that the proposed method on average outperforms other well-known approaches in terms of 0/1 loss, and multi-label accuracy and ranks second on the F-measure (after a method called ECC) and on Hamming loss (after a method called RF-PCT). |
format | Online Article Text |
id | pubmed-7924696 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2019 |
publisher | PeerJ Inc. |
record_format | MEDLINE/PubMed |
spelling | pubmed-79246962021-04-02 Nearest labelset using double distances for multi-label classification Gweon, Hyukjun Schonlau, Matthias Steiner, Stefan H. PeerJ Comput Sci Data Mining and Machine Learning Multi-label classification is a type of supervised learning where an instance may belong to multiple labels simultaneously. Predicting each label independently has been criticized for not exploiting any correlation between labels. In this article we propose a novel approach, Nearest Labelset using Double Distances (NLDD), that predicts the labelset observed in the training data that minimizes a weighted sum of the distances in both the feature space and the label space to the new instance. The weights specify the relative tradeoff between the two distances. The weights are estimated from a binomial regression of the number of misclassified labels as a function of the two distances. Model parameters are estimated by maximum likelihood. NLDD only considers labelsets observed in the training data, thus implicitly taking into account label dependencies. Experiments on benchmark multi-label data sets show that the proposed method on average outperforms other well-known approaches in terms of 0/1 loss, and multi-label accuracy and ranks second on the F-measure (after a method called ECC) and on Hamming loss (after a method called RF-PCT). PeerJ Inc. 2019-12-09 /pmc/articles/PMC7924696/ /pubmed/33816895 http://dx.doi.org/10.7717/peerj-cs.242 Text en ©2019 Gweon et al. https://creativecommons.org/licenses/by/4.0/ This is an open access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, reproduction and adaptation in any medium and for any purpose provided that it is properly attributed. For attribution, the original author(s), title, publication source (PeerJ Computer Science) and either DOI or URL of the article must be cited. |
spellingShingle | Data Mining and Machine Learning Gweon, Hyukjun Schonlau, Matthias Steiner, Stefan H. Nearest labelset using double distances for multi-label classification |
title | Nearest labelset using double distances for multi-label classification |
title_full | Nearest labelset using double distances for multi-label classification |
title_fullStr | Nearest labelset using double distances for multi-label classification |
title_full_unstemmed | Nearest labelset using double distances for multi-label classification |
title_short | Nearest labelset using double distances for multi-label classification |
title_sort | nearest labelset using double distances for multi-label classification |
topic | Data Mining and Machine Learning |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7924696/ https://www.ncbi.nlm.nih.gov/pubmed/33816895 http://dx.doi.org/10.7717/peerj-cs.242 |
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