Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging

BACKGROUND: Wheat spike architecture is a key determinant of multiple grain yield components and detailed examination of spike morphometric traits is beneficial to explain wheat grain yield and the effects of differing agronomy and genetics. However, quantification of spike morphometric traits has b...

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Detalles Bibliográficos
Autores principales: Zhou, Hu, Riche, Andrew B., Hawkesford, Malcolm J., Whalley, William R., Atkinson, Brian S., Sturrock, Craig J., Mooney, Sacha J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2021
Materias:
Methodology
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7945051/
https://www.ncbi.nlm.nih.gov/pubmed/33750418
http://dx.doi.org/10.1186/s13007-021-00726-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7945051/
https://www.ncbi.nlm.nih.gov/pubmed/33750418
http://dx.doi.org/10.1186/s13007-021-00726-5

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