Development and Comparative Analysis of Electrochemically Etched Tungsten Tips for Quartz Tuning Fork Sensor

Quartz Tuning Fork (QTF) based sensors are used for Scanning Probe Microscopes (SPM), in particular for near-field scanning optical microscopy. Highly sharp Tungsten (W) tips with larger cone angles and less tip diameter are critical for SPM instead of platinum and iridium (Pt/Ir) tips due to their...

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Detalles Bibliográficos
Autores principales: Ali, Ashfaq, Ullah, Naveed, Riaz, Asim Ahmad, Zahir, Muhammad Zeeshan, Khan, Zuhaib Ali, Shah, S. Shaukat Ali, Rehman Siddiqi, Muftooh Ur, Hassan, Muhammad Tahir
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8001380/
https://www.ncbi.nlm.nih.gov/pubmed/33800483
http://dx.doi.org/10.3390/mi12030286

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8001380/
https://www.ncbi.nlm.nih.gov/pubmed/33800483
http://dx.doi.org/10.3390/mi12030286

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