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Development and Comparative Analysis of Electrochemically Etched Tungsten Tips for Quartz Tuning Fork Sensor
Quartz Tuning Fork (QTF) based sensors are used for Scanning Probe Microscopes (SPM), in particular for near-field scanning optical microscopy. Highly sharp Tungsten (W) tips with larger cone angles and less tip diameter are critical for SPM instead of platinum and iridium (Pt/Ir) tips due to their...
Autores principales: | Ali, Ashfaq, Ullah, Naveed, Riaz, Asim Ahmad, Zahir, Muhammad Zeeshan, Khan, Zuhaib Ali, Shah, S. Shaukat Ali, Rehman Siddiqi, Muftooh Ur, Hassan, Muhammad Tahir |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8001380/ https://www.ncbi.nlm.nih.gov/pubmed/33800483 http://dx.doi.org/10.3390/mi12030286 |
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