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Microchip Health Monitoring System Using the FLL Circuit
Here a solution for a Microchip Health Monitoring (MHM) system using MTOL (Multi-Temperature Operational Life) reliability testing assessment data is proposed. The module monitors frequency degradation over time compared to lab tested data. Since trends in performance degradation in recently develop...
Autores principales: | Bender, Emmanuel, Bernstein, Joseph B. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8036875/ https://www.ncbi.nlm.nih.gov/pubmed/33805235 http://dx.doi.org/10.3390/s21072285 |
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