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Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry

[Image: see text] Polycrystalline textured thin films with distinct pleochroism and birefringence comprising oriented rotational domains of the orthorhombic polymorph of an anilino squaraine with isobutyl side chains (SQIB) are analyzed by imaging Mueller matrix ellipsometry to obtain the biaxial di...

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Autores principales: Funke, Sebastian, Duwe, Matthias, Balzer, Frank, Thiesen, Peter H., Hingerl, Kurt, Schiek, Manuela
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2021
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8041376/
https://www.ncbi.nlm.nih.gov/pubmed/33739845
http://dx.doi.org/10.1021/acs.jpclett.1c00317
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author Funke, Sebastian
Duwe, Matthias
Balzer, Frank
Thiesen, Peter H.
Hingerl, Kurt
Schiek, Manuela
author_facet Funke, Sebastian
Duwe, Matthias
Balzer, Frank
Thiesen, Peter H.
Hingerl, Kurt
Schiek, Manuela
author_sort Funke, Sebastian
collection PubMed
description [Image: see text] Polycrystalline textured thin films with distinct pleochroism and birefringence comprising oriented rotational domains of the orthorhombic polymorph of an anilino squaraine with isobutyl side chains (SQIB) are analyzed by imaging Mueller matrix ellipsometry to obtain the biaxial dielectric tensor. Simultaneous fitting of transmission and oblique incidence reflection Mueller matrix scans combined with the spatial resolution of an optical microscope allows to accurately determine the full biaxial dielectric tensor from a single crystallographic sample orientation. Oscillator dispersion relations model well the dielectric tensor components. Strong intermolecular interactions cause the real permittivity for all three directions to become strongly negative near the excitonic resonances, which is appealing for nanophotonic applications.
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spelling pubmed-80413762021-04-13 Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry Funke, Sebastian Duwe, Matthias Balzer, Frank Thiesen, Peter H. Hingerl, Kurt Schiek, Manuela J Phys Chem Lett [Image: see text] Polycrystalline textured thin films with distinct pleochroism and birefringence comprising oriented rotational domains of the orthorhombic polymorph of an anilino squaraine with isobutyl side chains (SQIB) are analyzed by imaging Mueller matrix ellipsometry to obtain the biaxial dielectric tensor. Simultaneous fitting of transmission and oblique incidence reflection Mueller matrix scans combined with the spatial resolution of an optical microscope allows to accurately determine the full biaxial dielectric tensor from a single crystallographic sample orientation. Oscillator dispersion relations model well the dielectric tensor components. Strong intermolecular interactions cause the real permittivity for all three directions to become strongly negative near the excitonic resonances, which is appealing for nanophotonic applications. American Chemical Society 2021-03-19 2021-04-01 /pmc/articles/PMC8041376/ /pubmed/33739845 http://dx.doi.org/10.1021/acs.jpclett.1c00317 Text en © 2021 The Authors. Published by American Chemical Society Permits the broadest form of re-use including for commercial purposes, provided that author attribution and integrity are maintained (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Funke, Sebastian
Duwe, Matthias
Balzer, Frank
Thiesen, Peter H.
Hingerl, Kurt
Schiek, Manuela
Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry
title Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry
title_full Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry
title_fullStr Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry
title_full_unstemmed Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry
title_short Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry
title_sort determining the dielectric tensor of microtextured organic thin films by imaging mueller matrix ellipsometry
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8041376/
https://www.ncbi.nlm.nih.gov/pubmed/33739845
http://dx.doi.org/10.1021/acs.jpclett.1c00317
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