Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure

We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. Th...

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Detalles Bibliográficos
Autores principales: Slouf, Miroslav, Skoupy, Radim, Pavlova, Ewa, Krzyzanek, Vladislav
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8070269/
https://www.ncbi.nlm.nih.gov/pubmed/33918700
http://dx.doi.org/10.3390/nano11040962

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8070269/
https://www.ncbi.nlm.nih.gov/pubmed/33918700
http://dx.doi.org/10.3390/nano11040962

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