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Magnification inferred curvature for real-time curvature monitoring

The in situ and real-time measurement of curvature changes of optically reflecting surfaces is a key element to better control bottom-up fabrication processes in the semiconductor industry, but also to follow or adjust mirror deformations during fabrication and use for space or optics industries. De...

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Detalles Bibliográficos
Autores principales: Arnoult, Alexandre, Colin, Jonathan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8087714/
https://www.ncbi.nlm.nih.gov/pubmed/33931683
http://dx.doi.org/10.1038/s41598-021-88722-6

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