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Exact statistical solution for the hopping transport of trapped charge via finite Markov jump processes
In this study, we developed a discrete theory of the charge transport in thin dielectric films by trapped electrons or holes, that is applicable both for the case of countable and a large number of traps. It was shown that Shockley–Read–Hall-like transport equations, which describe the 1D transport...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8119975/ https://www.ncbi.nlm.nih.gov/pubmed/33986313 http://dx.doi.org/10.1038/s41598-021-89280-7 |