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Genome-wide association mapping identifies yellow rust resistance loci in Ethiopian durum wheat germplasm

Durum wheat is an important cereal grown in Ethiopia, a country which is also its center for genetic diversity. Yellow (stripe) rust caused by Puccinia striiformis fsp tritici is one of the most devastating diseases threatening Ethiopian wheat production. To identify sources of genetic resistance an...

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Detalles Bibliográficos
Autores principales:	Alemu, Sisay Kidane, Huluka, Ayele Badebo, Tesfaye, Kassahun, Haileselassie, Teklehaimanot, Uauy, Cristobal
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Public Library of Science 2021
Materias:	Research Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8128278/ https://www.ncbi.nlm.nih.gov/pubmed/33999918 http://dx.doi.org/10.1371/journal.pone.0243675

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