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Improving the precision of optical metrology by detecting fewer photons with biased weak measurement

In optical metrological protocols to measure physical quantities, it is, in principle, always beneficial to increase photon number n to improve measurement precision. However, practical constraints prevent the arbitrary increase of n due to the imperfections of a practical detector, especially when...

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Autores principales: Yin, Peng, Zhang, Wen-Hao, Xu, Liang, Liu, Ze-Gang, Zhuang, Wei-Feng, Chen, Lei, Gong, Ming, Ma, Yu, Peng, Xing-Xiang, Li, Gong-Chu, Xu, Jin-Shi, Zhou, Zong-Quan, Zhang, Lijian, Chen, Geng, Li, Chuan-Feng, Guo, Guang-Can
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8128924/
https://www.ncbi.nlm.nih.gov/pubmed/34001846
http://dx.doi.org/10.1038/s41377-021-00543-4
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author Yin, Peng
Zhang, Wen-Hao
Xu, Liang
Liu, Ze-Gang
Zhuang, Wei-Feng
Chen, Lei
Gong, Ming
Ma, Yu
Peng, Xing-Xiang
Li, Gong-Chu
Xu, Jin-Shi
Zhou, Zong-Quan
Zhang, Lijian
Chen, Geng
Li, Chuan-Feng
Guo, Guang-Can
author_facet Yin, Peng
Zhang, Wen-Hao
Xu, Liang
Liu, Ze-Gang
Zhuang, Wei-Feng
Chen, Lei
Gong, Ming
Ma, Yu
Peng, Xing-Xiang
Li, Gong-Chu
Xu, Jin-Shi
Zhou, Zong-Quan
Zhang, Lijian
Chen, Geng
Li, Chuan-Feng
Guo, Guang-Can
author_sort Yin, Peng
collection PubMed
description In optical metrological protocols to measure physical quantities, it is, in principle, always beneficial to increase photon number n to improve measurement precision. However, practical constraints prevent the arbitrary increase of n due to the imperfections of a practical detector, especially when the detector response is dominated by the saturation effect. In this work, we show that a modified weak measurement protocol, namely, biased weak measurement significantly improves the precision of optical metrology in the presence of saturation effect. This method detects an ultra-small fraction of photons while maintains a considerable amount of metrological information. The biased pre-coupling leads to an additional reduction of photons in the post-selection and generates an extinction point in the spectrum distribution, which is extremely sensitive to the estimated parameter and difficult to be saturated. Therefore, the Fisher information can be persistently enhanced by increasing the photon number. In our magnetic-sensing experiment, biased weak measurement achieves precision approximately one order of magnitude better than those of previously used methods. The proposed method can be applied in various optical measurement schemes to remarkably mitigate the detector saturation effect with low-cost apparatuses.
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spelling pubmed-81289242021-05-27 Improving the precision of optical metrology by detecting fewer photons with biased weak measurement Yin, Peng Zhang, Wen-Hao Xu, Liang Liu, Ze-Gang Zhuang, Wei-Feng Chen, Lei Gong, Ming Ma, Yu Peng, Xing-Xiang Li, Gong-Chu Xu, Jin-Shi Zhou, Zong-Quan Zhang, Lijian Chen, Geng Li, Chuan-Feng Guo, Guang-Can Light Sci Appl Article In optical metrological protocols to measure physical quantities, it is, in principle, always beneficial to increase photon number n to improve measurement precision. However, practical constraints prevent the arbitrary increase of n due to the imperfections of a practical detector, especially when the detector response is dominated by the saturation effect. In this work, we show that a modified weak measurement protocol, namely, biased weak measurement significantly improves the precision of optical metrology in the presence of saturation effect. This method detects an ultra-small fraction of photons while maintains a considerable amount of metrological information. The biased pre-coupling leads to an additional reduction of photons in the post-selection and generates an extinction point in the spectrum distribution, which is extremely sensitive to the estimated parameter and difficult to be saturated. Therefore, the Fisher information can be persistently enhanced by increasing the photon number. In our magnetic-sensing experiment, biased weak measurement achieves precision approximately one order of magnitude better than those of previously used methods. The proposed method can be applied in various optical measurement schemes to remarkably mitigate the detector saturation effect with low-cost apparatuses. Nature Publishing Group UK 2021-05-17 /pmc/articles/PMC8128924/ /pubmed/34001846 http://dx.doi.org/10.1038/s41377-021-00543-4 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Yin, Peng
Zhang, Wen-Hao
Xu, Liang
Liu, Ze-Gang
Zhuang, Wei-Feng
Chen, Lei
Gong, Ming
Ma, Yu
Peng, Xing-Xiang
Li, Gong-Chu
Xu, Jin-Shi
Zhou, Zong-Quan
Zhang, Lijian
Chen, Geng
Li, Chuan-Feng
Guo, Guang-Can
Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
title Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
title_full Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
title_fullStr Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
title_full_unstemmed Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
title_short Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
title_sort improving the precision of optical metrology by detecting fewer photons with biased weak measurement
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8128924/
https://www.ncbi.nlm.nih.gov/pubmed/34001846
http://dx.doi.org/10.1038/s41377-021-00543-4
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