Cargando…
High-Performance Resistive Switching in Solution-Derived IGZO:N Memristors by Microwave-Assisted Nitridation
In this study, we implemented a high-performance two-terminal memristor device with a metal/insulator/metal (MIM) structure using a solution-derived In-Ga-Zn-Oxide (IGZO)-based nanocomposite as a resistive switching (RS) layer. In order to secure stable memristive switching characteristics, IGZO:N n...
Autores principales: | Min, Shin-Yi, Cho, Won-Ju |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8143479/ https://www.ncbi.nlm.nih.gov/pubmed/33922130 http://dx.doi.org/10.3390/nano11051081 |
Ejemplares similares
-
Memristors Using Solution-Based IGZO Nanoparticles
por: Rosa, Jose, et al.
Publicado: (2017) -
Emergent solution based IGZO memristor towards neuromorphic applications
por: Martins, Raquel Azevedo, et al.
Publicado: (2022) -
Habituation/Fatigue behavior of a synapse memristor based on IGZO–HfO(2) thin film
por: Jiang, Ran, et al.
Publicado: (2017) -
Effect of Post-Annealing on Barrier Modulations in Pd/IGZO/SiO(2)/p(+)-Si Memristors
por: Kim, Donguk, et al.
Publicado: (2022) -
Thermal Damage-Free Microwave Annealing with Efficient Energy Conversion for Fabricating of High-Performance a-IGZO Thin-Film Transistors on Flexible Substrates
por: Park, Ki-Woong, et al.
Publicado: (2021)