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Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties

Structural and electrical properties of epitaxial Pb(Zr(0.2)Ti(0.8))O(3) films grown by pulsed laser deposition from targets with different purities are investigated in this study. One target was produced in-house by using high purity precursor oxides (at least 99.99%), and the other target was a co...

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Autores principales: Boni, Georgia Andra, Chirila, Cristina Florentina, Stancu, Viorica, Amarande, Luminita, Pasuk, Iuliana, Trupina, Lucian, Istrate, Cosmin Marian, Radu, Cristian, Tomulescu, Andrei, Neatu, Stefan, Pintilie, Ioana, Pintilie, Lucian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8146871/
https://www.ncbi.nlm.nih.gov/pubmed/33947129
http://dx.doi.org/10.3390/nano11051177
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author Boni, Georgia Andra
Chirila, Cristina Florentina
Stancu, Viorica
Amarande, Luminita
Pasuk, Iuliana
Trupina, Lucian
Istrate, Cosmin Marian
Radu, Cristian
Tomulescu, Andrei
Neatu, Stefan
Pintilie, Ioana
Pintilie, Lucian
author_facet Boni, Georgia Andra
Chirila, Cristina Florentina
Stancu, Viorica
Amarande, Luminita
Pasuk, Iuliana
Trupina, Lucian
Istrate, Cosmin Marian
Radu, Cristian
Tomulescu, Andrei
Neatu, Stefan
Pintilie, Ioana
Pintilie, Lucian
author_sort Boni, Georgia Andra
collection PubMed
description Structural and electrical properties of epitaxial Pb(Zr(0.2)Ti(0.8))O(3) films grown by pulsed laser deposition from targets with different purities are investigated in this study. One target was produced in-house by using high purity precursor oxides (at least 99.99%), and the other target was a commercial product (99.9% purity). It was found that the out-of-plane lattice constant is about 0.15% larger and the a domains amount is lower for the film grown from the commercial target. The polarization value is slightly lower, the dielectric constant is larger, and the height of the potential barrier at the electrode interfaces is larger for the film deposited from the pure target. The differences are attributed to the accidental impurities, with a larger amount in the commercial target as revealed by composition analysis using inductive coupling plasma-mass spectrometry. The heterovalent impurities can act as donors or acceptors, modifying the electronic characteristics. Thus, mastering impurities is a prerequisite for obtaining reliable and reproducible properties and advancing towards all ferroelectric devices.
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spelling pubmed-81468712021-05-26 Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties Boni, Georgia Andra Chirila, Cristina Florentina Stancu, Viorica Amarande, Luminita Pasuk, Iuliana Trupina, Lucian Istrate, Cosmin Marian Radu, Cristian Tomulescu, Andrei Neatu, Stefan Pintilie, Ioana Pintilie, Lucian Nanomaterials (Basel) Article Structural and electrical properties of epitaxial Pb(Zr(0.2)Ti(0.8))O(3) films grown by pulsed laser deposition from targets with different purities are investigated in this study. One target was produced in-house by using high purity precursor oxides (at least 99.99%), and the other target was a commercial product (99.9% purity). It was found that the out-of-plane lattice constant is about 0.15% larger and the a domains amount is lower for the film grown from the commercial target. The polarization value is slightly lower, the dielectric constant is larger, and the height of the potential barrier at the electrode interfaces is larger for the film deposited from the pure target. The differences are attributed to the accidental impurities, with a larger amount in the commercial target as revealed by composition analysis using inductive coupling plasma-mass spectrometry. The heterovalent impurities can act as donors or acceptors, modifying the electronic characteristics. Thus, mastering impurities is a prerequisite for obtaining reliable and reproducible properties and advancing towards all ferroelectric devices. MDPI 2021-04-29 /pmc/articles/PMC8146871/ /pubmed/33947129 http://dx.doi.org/10.3390/nano11051177 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Boni, Georgia Andra
Chirila, Cristina Florentina
Stancu, Viorica
Amarande, Luminita
Pasuk, Iuliana
Trupina, Lucian
Istrate, Cosmin Marian
Radu, Cristian
Tomulescu, Andrei
Neatu, Stefan
Pintilie, Ioana
Pintilie, Lucian
Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties
title Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties
title_full Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties
title_fullStr Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties
title_full_unstemmed Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties
title_short Accidental Impurities in Epitaxial Pb(Zr(0.2)Ti(0.8))O(3) Thin Films Grown by Pulsed Laser Deposition and Their Impact on the Macroscopic Electric Properties
title_sort accidental impurities in epitaxial pb(zr(0.2)ti(0.8))o(3) thin films grown by pulsed laser deposition and their impact on the macroscopic electric properties
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8146871/
https://www.ncbi.nlm.nih.gov/pubmed/33947129
http://dx.doi.org/10.3390/nano11051177
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