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Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon

Mid-infrared (MIR) wavelengths (2–10 [Formula: see text] m) open up a new paradigm for femtosecond laser–solid interactions. On a fundamental level, compared to the ubiquitous near-IR (NIR) or visible (VIS) laser interactions, MIR photon energies render semiconductors to behave like high bandgap mat...

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Detalles Bibliográficos
Autores principales: Werner, Kevin, Chowdhury, Enam
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8147261/
https://www.ncbi.nlm.nih.gov/pubmed/33946520
http://dx.doi.org/10.3390/nano11051192
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author Werner, Kevin
Chowdhury, Enam
author_facet Werner, Kevin
Chowdhury, Enam
author_sort Werner, Kevin
collection PubMed
description Mid-infrared (MIR) wavelengths (2–10 [Formula: see text] m) open up a new paradigm for femtosecond laser–solid interactions. On a fundamental level, compared to the ubiquitous near-IR (NIR) or visible (VIS) laser interactions, MIR photon energies render semiconductors to behave like high bandgap materials, while driving conduction band electrons harder due to the [Formula: see text] [Formula: see text] scaling of the ponderomotive energy. From an applications perspective, many VIS/NIR opaque materials are transparent for MIR. This allows sub-surface modifications for waveguide writing while simultaneously extending interactions to higher order processes. Here, we present the formation of an extreme sub-wavelength structure formation (∼ [Formula: see text]) on a single crystal silicon surface by a 3600 nm MIR femtosecond laser with a pulse duration of 200 fs. The 50–100 nm linear structures were aligned parallel to the laser polarization direction with a quasi-periodicity of 700 nm. The dependence of the structure on the native oxide, laser pulse number, and polarization were studied. The properties of the structures were studied using scanning electron microscopy (SEM), atomic force microscopy (AFM), cross-sectional transmission electron-microscopy (CS-TEM), electron diffraction (ED), and energy-dispersive X-ray spectroscopy (EDX). As traditional models for the formation of laser induced periodic surface structure do not explain this structure formation, new theoretical efforts are needed.
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spelling pubmed-81472612021-05-26 Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon Werner, Kevin Chowdhury, Enam Nanomaterials (Basel) Article Mid-infrared (MIR) wavelengths (2–10 [Formula: see text] m) open up a new paradigm for femtosecond laser–solid interactions. On a fundamental level, compared to the ubiquitous near-IR (NIR) or visible (VIS) laser interactions, MIR photon energies render semiconductors to behave like high bandgap materials, while driving conduction band electrons harder due to the [Formula: see text] [Formula: see text] scaling of the ponderomotive energy. From an applications perspective, many VIS/NIR opaque materials are transparent for MIR. This allows sub-surface modifications for waveguide writing while simultaneously extending interactions to higher order processes. Here, we present the formation of an extreme sub-wavelength structure formation (∼ [Formula: see text]) on a single crystal silicon surface by a 3600 nm MIR femtosecond laser with a pulse duration of 200 fs. The 50–100 nm linear structures were aligned parallel to the laser polarization direction with a quasi-periodicity of 700 nm. The dependence of the structure on the native oxide, laser pulse number, and polarization were studied. The properties of the structures were studied using scanning electron microscopy (SEM), atomic force microscopy (AFM), cross-sectional transmission electron-microscopy (CS-TEM), electron diffraction (ED), and energy-dispersive X-ray spectroscopy (EDX). As traditional models for the formation of laser induced periodic surface structure do not explain this structure formation, new theoretical efforts are needed. MDPI 2021-04-30 /pmc/articles/PMC8147261/ /pubmed/33946520 http://dx.doi.org/10.3390/nano11051192 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Werner, Kevin
Chowdhury, Enam
Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon
title Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon
title_full Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon
title_fullStr Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon
title_full_unstemmed Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon
title_short Extreme Sub-Wavelength Structure Formation from Mid-IR Femtosecond Laser Interaction with Silicon
title_sort extreme sub-wavelength structure formation from mid-ir femtosecond laser interaction with silicon
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8147261/
https://www.ncbi.nlm.nih.gov/pubmed/33946520
http://dx.doi.org/10.3390/nano11051192
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