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Superheat of silicon crystals observed by live X-ray topography
In-situ observations of Si crystal growth and melting have been carried out by live X-ray diffraction topography. Superheated solid states beyond the melting point was observed for dislocation-free crystals with melting in their inside. Dislocations were found to impede superheat and to melt the cry...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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The Japan Academy
2004
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8147664/ |