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Implementation of a fully implantable middle-ear hearing device chip

BACKGROUND AND OBJECTIVE: Recently, with the increase in the population of hearing impaired people, various types of hearing aids have been rapidly developed. In particular, a fully implantable middle ear hearing device (F-IMEHD) is developed for people with sensorineural hearing loss. The F-IMEHD s...

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Detalles Bibliográficos
Autores principales: Lee, Jyung Hyun, Kim, Dong Wook, Seong, Ki Woong, Kim, Myoung Nam, Cho, Jin-Ho
Formato: Online Artículo Texto
Lenguaje:English
Publicado: IOS Press 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8150658/
https://www.ncbi.nlm.nih.gov/pubmed/33682777
http://dx.doi.org/10.3233/THC-218038
Descripción
Sumario:BACKGROUND AND OBJECTIVE: Recently, with the increase in the population of hearing impaired people, various types of hearing aids have been rapidly developed. In particular, a fully implantable middle ear hearing device (F-IMEHD) is developed for people with sensorineural hearing loss. The F-IMEHD system comprises an implantable microphone, a transducer, and a signal processor. The signal processor should have a small size and consume less power for implantation in a human body. METHODS: In this study, we designed and fabricated a signal-processing chip using the modified FFT algorithm. This algorithm was developed focusing on eliminating time delay and system complexity in the transform process. The designed signal-processing chip comprises a 4-channel WDRC, a fitting memory, a communication 1control part, and a pulse density modulator. Each channel is separated using a 64-point fast Fourier transform (FFT) method and the gain value is matched using the fitting table in the fitting memory. RESULTS AND CONCLUSION: The chip was designed by Verilog-HDL and the designed HDL codes were verified by Modelsim-PE 10.3 (Mentor graphics, USA). The chip was fabricated using a 0.18 [Formula: see text] m CMOS process (SMIC, China). Experiments were performed on a cadaver to verify the performance of the fabricated chip.