Using TOF-SIMS Spectrometry to Study the Kinetics of the Interfacial Retro Diels–Alder Reaction

In this work, the use of Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) was explored as a technique for monitoring the interfacial retro Diels–Alder (retro DA) reaction occurring on well-controlled self-assembled monolayers (SAMs). A molecule containing a Diels–Alder (DA) adduct was graft...

Descripción completa

Detalles Bibliográficos
Autores principales: Hassouna, Lilia, Enganati, Sachin Kumar, Bally-Le Gall, Florence, Mertz, Grégory, Bour, Jérôme, Ruch, David, Roucoules, Vincent
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8161361/
https://www.ncbi.nlm.nih.gov/pubmed/34065263
http://dx.doi.org/10.3390/ma14102674

Ejemplares similares

Ejemplares similares