Principal component analysis is limited to low-resolution analysis in cryoEM

Principal component analysis (PCA) has been widely proposed to analyze flexibility and heterogeneity in cryo-electron microscopy (cryoEM). In this paper, it is argued that (i) PCA is an excellent technique to describe continuous flexibility at low resolution (but not so much at high resolution) and...

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Detalles Bibliográficos
Autores principales: Sorzano, Carlos Oscar S., Carazo, Jose Maria
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8171071/
https://www.ncbi.nlm.nih.gov/pubmed/34076596
http://dx.doi.org/10.1107/S2059798321002291
Descripción
Sumario:Principal component analysis (PCA) has been widely proposed to analyze flexibility and heterogeneity in cryo-electron microscopy (cryoEM). In this paper, it is argued that (i) PCA is an excellent technique to describe continuous flexibility at low resolution (but not so much at high resolution) and (ii) PCA components should be analyzed in a concerted manner (and not independently).

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