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A system of quantities from software metrology()
International Organization for Standardization (ISO)/International Electrotechnical Commission (IEC) 80000, the International System of Quantities, collects and organizes the most important physical quantities into a coherent system of quantities whose foundation for measurements is the Internationa...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
2021
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8174576/ https://www.ncbi.nlm.nih.gov/pubmed/34092878 http://dx.doi.org/10.1016/j.measurement.2020.108435 |
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author | Flater, David |
author_facet | Flater, David |
author_sort | Flater, David |
collection | PubMed |
description | International Organization for Standardization (ISO)/International Electrotechnical Commission (IEC) 80000, the International System of Quantities, collects and organizes the most important physical quantities into a coherent system of quantities whose foundation for measurements is the International System of Units (SI). This short communication outlines a report that, in a similar fashion, collects and organizes the most important quantities used in measurements performed on software artifacts, focusing on software as a product rather than its development process. |
format | Online Article Text |
id | pubmed-8174576 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
record_format | MEDLINE/PubMed |
spelling | pubmed-81745762021-06-03 A system of quantities from software metrology() Flater, David Measurement (Lond) Article International Organization for Standardization (ISO)/International Electrotechnical Commission (IEC) 80000, the International System of Quantities, collects and organizes the most important physical quantities into a coherent system of quantities whose foundation for measurements is the International System of Units (SI). This short communication outlines a report that, in a similar fashion, collects and organizes the most important quantities used in measurements performed on software artifacts, focusing on software as a product rather than its development process. 2021 /pmc/articles/PMC8174576/ /pubmed/34092878 http://dx.doi.org/10.1016/j.measurement.2020.108435 Text en https://creativecommons.org/licenses/by/4.0/This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) ). |
spellingShingle | Article Flater, David A system of quantities from software metrology() |
title | A system of quantities from software metrology() |
title_full | A system of quantities from software metrology() |
title_fullStr | A system of quantities from software metrology() |
title_full_unstemmed | A system of quantities from software metrology() |
title_short | A system of quantities from software metrology() |
title_sort | system of quantities from software metrology() |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8174576/ https://www.ncbi.nlm.nih.gov/pubmed/34092878 http://dx.doi.org/10.1016/j.measurement.2020.108435 |
work_keys_str_mv | AT flaterdavid asystemofquantitiesfromsoftwaremetrology AT flaterdavid systemofquantitiesfromsoftwaremetrology |