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Determining amplitude and tilt of a lateral force microscopy sensor

In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the osci...

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Detalles Bibliográficos
Autores principales:	Gretz, Oliver, Weymouth, Alfred J, Holzmann, Thomas, Pürckhauer, Korbinian, Giessibl, Franz J
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2021
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8182685/ https://www.ncbi.nlm.nih.gov/pubmed/34136327 http://dx.doi.org/10.3762/bjnano.12.42

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