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Characterization and Mapping of Spot Blotch in Triticum durum–Aegilops speltoides Introgression Lines Using SNP Markers

Spot blotch (SB) of wheat is emerging as a major threat to successful wheat production in warm and humid areas of the world. SB, also called leaf blight, is caused by Bipolaris sorokiniana, and is responsible for high yield losses in Eastern Gangetic Plains Zone in India. More recently, SB is extend...

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Detalles Bibliográficos
Autores principales:	Kaur, Jashanpreet, Kaur, Jaspal, Dhillon, Guriqbal Singh, Kaur, Harmandeep, Singh, Jasvir, Bala, Ritu, Srivastava, Puja, Kaur, Satinder, Sharma, Achla, Chhuneja, Parveen
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Frontiers Media S.A. 2021
Materias:	Plant Science
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8193842/ https://www.ncbi.nlm.nih.gov/pubmed/34122476 http://dx.doi.org/10.3389/fpls.2021.650400

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