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Improving Manufacturing Applications of Machine Learning by Understanding Defect Classification and the Critical Error Threshold

Machine learning (ML) is unlocking patterns and insight into data to provide financial value and knowledge for organizations. Use of machine learning in manufacturing environments is increasing, yet sometimes these applications fail to produce meaningful results. A critical review of how defects are...

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Detalles Bibliográficos
Autor principal: Blondheim, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8223532/
http://dx.doi.org/10.1007/s40962-021-00637-0