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Improving Manufacturing Applications of Machine Learning by Understanding Defect Classification and the Critical Error Threshold
Machine learning (ML) is unlocking patterns and insight into data to provide financial value and knowledge for organizations. Use of machine learning in manufacturing environments is increasing, yet sometimes these applications fail to produce meaningful results. A critical review of how defects are...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Springer International Publishing
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8223532/ http://dx.doi.org/10.1007/s40962-021-00637-0 |