Accurate localization microscopy by intrinsic aberration calibration

A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard paradigm, introducing the concept of fully ex...

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Detalles Bibliográficos
Autores principales: Copeland, Craig R., McGray, Craig D., Ilic, B. Robert, Geist, Jon, Stavis, Samuel M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8225824/
https://www.ncbi.nlm.nih.gov/pubmed/34168121
http://dx.doi.org/10.1038/s41467-021-23419-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8225824/
https://www.ncbi.nlm.nih.gov/pubmed/34168121
http://dx.doi.org/10.1038/s41467-021-23419-y

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