Cargando…
Ellipsometry Study of CdSe Thin Films Deposited by PLD on ITO Coated Glass Substrates
Cadmium selenide (CdSe) thin films were deposited on indium tin oxide (ITO) coated glass substrates using pulsed laser deposition (PLD) technique under different growth temperatures. Samples were investigated for their structural, morphological, and optical properties through X-ray diffraction (XRD)...
Autores principales: | Inbanathan, Flavia P. N., Kumar, Pawan, Dasari, Kiran, Katiyar, Ram S., Chen, Jixin, Jadwisienczak, Wojciech M. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8232614/ https://www.ncbi.nlm.nih.gov/pubmed/34203798 http://dx.doi.org/10.3390/ma14123307 |
Ejemplares similares
-
Analysis of chemically deposited CdSe and CdS thin films
por: Osuji, R U
Publicado: (2002) -
Controlled
Assembly of CdSe Nanoplatelet Thin Films
and Nanowires
por: Marino, Emanuele, et al.
Publicado: (2023) -
Inorganic Thin-film Sensor Membranes with PLD-prepared Chalcogenide Glasses: Challenges and Implementation
por: Kloock, Joachim P., et al.
Publicado: (2004) -
Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film
por: Janicek, Petr, et al.
Publicado: (2021) -
Temperature-Dependent Spectroscopic Ellipsometry of
Thin Polymer Films
por: Hajduk, Barbara, et al.
Publicado: (2020)