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Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method
Fault detection and classification are two of the challenging tasks in Modular Multilevel Converters in High Voltage Direct Current (MMC-HVDC) systems. To directly classify the raw sensor data without certain feature extraction and classifier design, a long short-term memory (LSTM) neural network is...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8234543/ https://www.ncbi.nlm.nih.gov/pubmed/34204443 http://dx.doi.org/10.3390/s21124159 |
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author | Wang, Qinghua Yu, Yuexiao Ahmed, Hosameldin O. A. Darwish, Mohamed Nandi, Asoke K. |
author_facet | Wang, Qinghua Yu, Yuexiao Ahmed, Hosameldin O. A. Darwish, Mohamed Nandi, Asoke K. |
author_sort | Wang, Qinghua |
collection | PubMed |
description | Fault detection and classification are two of the challenging tasks in Modular Multilevel Converters in High Voltage Direct Current (MMC-HVDC) systems. To directly classify the raw sensor data without certain feature extraction and classifier design, a long short-term memory (LSTM) neural network is proposed and used for seven states of the MMC-HVDC transmission power system simulated by Power Systems Computer Aided Design/Electromagnetic Transients including DC (PSCAD/EMTDC). It is observed that the LSTM method can detect faults with 100% accuracy and classify different faults as well as provide promising fault classification performance. Compared with a bidirectional LSTM (BiLSTM), the LSTM can get similar classification accuracy, requiring less training time and testing time. Compared with Convolutional Neural Networks (CNN) and AutoEncoder-based deep neural networks (AE-based DNN), the LSTM method can get better classification accuracy around the middle of the testing data proportion, but it needs more training time. |
format | Online Article Text |
id | pubmed-8234543 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-82345432021-06-27 Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method Wang, Qinghua Yu, Yuexiao Ahmed, Hosameldin O. A. Darwish, Mohamed Nandi, Asoke K. Sensors (Basel) Article Fault detection and classification are two of the challenging tasks in Modular Multilevel Converters in High Voltage Direct Current (MMC-HVDC) systems. To directly classify the raw sensor data without certain feature extraction and classifier design, a long short-term memory (LSTM) neural network is proposed and used for seven states of the MMC-HVDC transmission power system simulated by Power Systems Computer Aided Design/Electromagnetic Transients including DC (PSCAD/EMTDC). It is observed that the LSTM method can detect faults with 100% accuracy and classify different faults as well as provide promising fault classification performance. Compared with a bidirectional LSTM (BiLSTM), the LSTM can get similar classification accuracy, requiring less training time and testing time. Compared with Convolutional Neural Networks (CNN) and AutoEncoder-based deep neural networks (AE-based DNN), the LSTM method can get better classification accuracy around the middle of the testing data proportion, but it needs more training time. MDPI 2021-06-17 /pmc/articles/PMC8234543/ /pubmed/34204443 http://dx.doi.org/10.3390/s21124159 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Wang, Qinghua Yu, Yuexiao Ahmed, Hosameldin O. A. Darwish, Mohamed Nandi, Asoke K. Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method |
title | Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method |
title_full | Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method |
title_fullStr | Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method |
title_full_unstemmed | Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method |
title_short | Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method |
title_sort | open-circuit fault detection and classification of modular multilevel converters in high voltage direct current systems (mmc-hvdc) with long short-term memory (lstm) method |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8234543/ https://www.ncbi.nlm.nih.gov/pubmed/34204443 http://dx.doi.org/10.3390/s21124159 |
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