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Comparing Xe(+)pFIB and Ga(+)FIB for TEM sample preparation of Al alloys: Minimising FIB‐induced artefacts
Recently, the dual beam Xe(+) plasma focused ion beam (Xe(+)pFIB) instrument has attracted increasing interest for site‐specific transmission electron microscopy (TEM) sample preparation for a local region of interest as it shows several potential benefits compared to conventional Ga(+)FIB milling....
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
John Wiley and Sons Inc.
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8246817/ https://www.ncbi.nlm.nih.gov/pubmed/33210738 http://dx.doi.org/10.1111/jmi.12983 |