Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique

We investigate the sensitivity of symmetry quantification algorithms based on the profile R-factor (R(p)) and the normalized cross-correlation (NCC) coefficient (γ). A DM (Digital Micrograph(©)) script embedded in the Gatan digital microscopy software is used to develop the symmetry quantification p...

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Autores principales: So, Hyeongsub, Lee, Ro Woon, Hong, Sung Taek, Kim, Kyou-Hyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Singapore 2021
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8254841/
https://www.ncbi.nlm.nih.gov/pubmed/34216303
http://dx.doi.org/10.1186/s42649-021-00060-z
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author So, Hyeongsub
Lee, Ro Woon
Hong, Sung Taek
Kim, Kyou-Hyun
author_facet So, Hyeongsub
Lee, Ro Woon
Hong, Sung Taek
Kim, Kyou-Hyun
author_sort So, Hyeongsub
collection PubMed
description We investigate the sensitivity of symmetry quantification algorithms based on the profile R-factor (R(p)) and the normalized cross-correlation (NCC) coefficient (γ). A DM (Digital Micrograph(©)) script embedded in the Gatan digital microscopy software is used to develop the symmetry quantification program. Using the Bloch method, a variety of CBED patterns are simulated and used to investigate the sensitivity of symmetry quantification algorithms. The quantification results show that two symmetry quantification coefficients are significantly sensitive to structural changes even for small strain values of < 1%.
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spelling pubmed-82548412021-07-20 Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique So, Hyeongsub Lee, Ro Woon Hong, Sung Taek Kim, Kyou-Hyun Appl Microsc Research We investigate the sensitivity of symmetry quantification algorithms based on the profile R-factor (R(p)) and the normalized cross-correlation (NCC) coefficient (γ). A DM (Digital Micrograph(©)) script embedded in the Gatan digital microscopy software is used to develop the symmetry quantification program. Using the Bloch method, a variety of CBED patterns are simulated and used to investigate the sensitivity of symmetry quantification algorithms. The quantification results show that two symmetry quantification coefficients are significantly sensitive to structural changes even for small strain values of < 1%. Springer Singapore 2021-07-03 /pmc/articles/PMC8254841/ /pubmed/34216303 http://dx.doi.org/10.1186/s42649-021-00060-z Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Research
So, Hyeongsub
Lee, Ro Woon
Hong, Sung Taek
Kim, Kyou-Hyun
Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
title Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
title_full Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
title_fullStr Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
title_full_unstemmed Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
title_short Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
title_sort sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
topic Research
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8254841/
https://www.ncbi.nlm.nih.gov/pubmed/34216303
http://dx.doi.org/10.1186/s42649-021-00060-z
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