Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems

In this study, tensile tests on aluminum/silicon vertically cracked nanofilm/substrate systems were performed using atomistic simulations. Various crystallographic orientations and thicknesses of the aluminum nanofilms were considered to analyze the effects of these factors on the reliability of the...

Descripción completa

Detalles Bibliográficos
Autores principales: Shim, Jee S., Go, Dong H., Beom, Hyeon G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8269626/
https://www.ncbi.nlm.nih.gov/pubmed/34202280
http://dx.doi.org/10.3390/ma14133570

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8269626/
https://www.ncbi.nlm.nih.gov/pubmed/34202280
http://dx.doi.org/10.3390/ma14133570

Ejemplares similares