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Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems

In this study, tensile tests on aluminum/silicon vertically cracked nanofilm/substrate systems were performed using atomistic simulations. Various crystallographic orientations and thicknesses of the aluminum nanofilms were considered to analyze the effects of these factors on the reliability of the...

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Detalles Bibliográficos
Autores principales: Shim, Jee S., Go, Dong H., Beom, Hyeon G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8269626/
https://www.ncbi.nlm.nih.gov/pubmed/34202280
http://dx.doi.org/10.3390/ma14133570

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