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Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization

Solar cells may possess defects during the manufacturing process in photovoltaic (PV) industries. To precisely evaluate the effectiveness of solar PV modules, manufacturing defects are required to be identified. Conventional defect inspection in industries mainly depends on manual defect inspection...

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Autores principales: Lin, Horng-Horng, Dandage, Harshad Kumar, Lin, Keh-Moh, Lin, You-Teh, Chen, Yeou-Jiunn
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8271833/
https://www.ncbi.nlm.nih.gov/pubmed/34201774
http://dx.doi.org/10.3390/s21134292
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author Lin, Horng-Horng
Dandage, Harshad Kumar
Lin, Keh-Moh
Lin, You-Teh
Chen, Yeou-Jiunn
author_facet Lin, Horng-Horng
Dandage, Harshad Kumar
Lin, Keh-Moh
Lin, You-Teh
Chen, Yeou-Jiunn
author_sort Lin, Horng-Horng
collection PubMed
description Solar cells may possess defects during the manufacturing process in photovoltaic (PV) industries. To precisely evaluate the effectiveness of solar PV modules, manufacturing defects are required to be identified. Conventional defect inspection in industries mainly depends on manual defect inspection by highly skilled inspectors, which may still give inconsistent, subjective identification results. In order to automatize the visual defect inspection process, an automatic cell segmentation technique and a convolutional neural network (CNN)-based defect detection system with pseudo-colorization of defects is designed in this paper. High-resolution Electroluminescence (EL) images of single-crystalline silicon (sc-Si) solar PV modules are used in our study for the detection of defects and their quality inspection. Firstly, an automatic cell segmentation methodology is developed to extract cells from an EL image. Secondly, defect detection can be actualized by CNN-based defect detector and can be visualized with pseudo-colors. We used contour tracing to accurately localize the panel region and a probabilistic Hough transform to identify gridlines and busbars on the extracted panel region for cell segmentation. A cell-based defect identification system was developed using state-of-the-art deep learning in CNNs. The detected defects are imposed with pseudo-colors for enhancing defect visualization using K-means clustering. Our automatic cell segmentation methodology can segment cells from an EL image in about [Formula: see text] s. The average segmentation errors along the x-direction and y-direction are only [Formula: see text] pixels and [Formula: see text] pixels, respectively. The defect detection approach on segmented cells achieves [Formula: see text] accuracy. Along with defect detection, the defect regions on a cell are furnished with pseudo-colors to enhance the visualization.
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spelling pubmed-82718332021-07-11 Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization Lin, Horng-Horng Dandage, Harshad Kumar Lin, Keh-Moh Lin, You-Teh Chen, Yeou-Jiunn Sensors (Basel) Article Solar cells may possess defects during the manufacturing process in photovoltaic (PV) industries. To precisely evaluate the effectiveness of solar PV modules, manufacturing defects are required to be identified. Conventional defect inspection in industries mainly depends on manual defect inspection by highly skilled inspectors, which may still give inconsistent, subjective identification results. In order to automatize the visual defect inspection process, an automatic cell segmentation technique and a convolutional neural network (CNN)-based defect detection system with pseudo-colorization of defects is designed in this paper. High-resolution Electroluminescence (EL) images of single-crystalline silicon (sc-Si) solar PV modules are used in our study for the detection of defects and their quality inspection. Firstly, an automatic cell segmentation methodology is developed to extract cells from an EL image. Secondly, defect detection can be actualized by CNN-based defect detector and can be visualized with pseudo-colors. We used contour tracing to accurately localize the panel region and a probabilistic Hough transform to identify gridlines and busbars on the extracted panel region for cell segmentation. A cell-based defect identification system was developed using state-of-the-art deep learning in CNNs. The detected defects are imposed with pseudo-colors for enhancing defect visualization using K-means clustering. Our automatic cell segmentation methodology can segment cells from an EL image in about [Formula: see text] s. The average segmentation errors along the x-direction and y-direction are only [Formula: see text] pixels and [Formula: see text] pixels, respectively. The defect detection approach on segmented cells achieves [Formula: see text] accuracy. Along with defect detection, the defect regions on a cell are furnished with pseudo-colors to enhance the visualization. MDPI 2021-06-23 /pmc/articles/PMC8271833/ /pubmed/34201774 http://dx.doi.org/10.3390/s21134292 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Lin, Horng-Horng
Dandage, Harshad Kumar
Lin, Keh-Moh
Lin, You-Teh
Chen, Yeou-Jiunn
Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization
title Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization
title_full Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization
title_fullStr Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization
title_full_unstemmed Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization
title_short Efficient Cell Segmentation from Electroluminescent Images of Single-Crystalline Silicon Photovoltaic Modules and Cell-Based Defect Identification Using Deep Learning with Pseudo-Colorization
title_sort efficient cell segmentation from electroluminescent images of single-crystalline silicon photovoltaic modules and cell-based defect identification using deep learning with pseudo-colorization
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8271833/
https://www.ncbi.nlm.nih.gov/pubmed/34201774
http://dx.doi.org/10.3390/s21134292
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