Super-compression of large electron microscopy time series by deep compressive sensing learning

The development of ultrafast detectors for electron microscopy (EM) opens a new door to exploring dynamics of nanomaterials; however, it raises grand challenges for big data processing and storage. Here, we combine deep learning and temporal compressive sensing (TCS) to propose a novel EM big data c...

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Detalles Bibliográficos
Autores principales: Zheng, Siming, Wang, Chunyang, Yuan, Xin, Xin, Huolin L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8276025/
https://www.ncbi.nlm.nih.gov/pubmed/34286306
http://dx.doi.org/10.1016/j.patter.2021.100292

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8276025/
https://www.ncbi.nlm.nih.gov/pubmed/34286306
http://dx.doi.org/10.1016/j.patter.2021.100292

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