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Super-compression of large electron microscopy time series by deep compressive sensing learning
The development of ultrafast detectors for electron microscopy (EM) opens a new door to exploring dynamics of nanomaterials; however, it raises grand challenges for big data processing and storage. Here, we combine deep learning and temporal compressive sensing (TCS) to propose a novel EM big data c...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8276025/ https://www.ncbi.nlm.nih.gov/pubmed/34286306 http://dx.doi.org/10.1016/j.patter.2021.100292 |