Cargando…
Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data
Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant, noisy and/or irrelevant to the problems of interest, and it remains nontrivial to draw...
| Autores principales: | , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Oxford University Press
2019
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8291420/ https://www.ncbi.nlm.nih.gov/pubmed/34691831 http://dx.doi.org/10.1093/nsr/nwy096 |