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Synthetic Data in Quantitative Scanning Probe Microscopy
Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in sc...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8308173/ https://www.ncbi.nlm.nih.gov/pubmed/34361132 http://dx.doi.org/10.3390/nano11071746 |