Letter to the Editor: New Values for Silicon Reference Materials, Certified for Isotope Abundance Ratios

New isotope abundance and relative atomic mass (atomic weight) values — with low, hitherto unattained uncertainty — are reported for two previously described silicon reference materials using a well-known method with an improved isotope-ratio mass spectrometer. These new values are directly traceabl...

Descripción completa

Detalles Bibliográficos
Autores principales: De Bièvre, P., Valkiers, S., Peiser, H. S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1994
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8345240/
https://www.ncbi.nlm.nih.gov/pubmed/37404709
http://dx.doi.org/10.6028/jres.099.016

Ejemplares similares

Ejemplares similares