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The Measurement and Uncertainty of a Calibration Standard for the Scanning Electron Microscope
Standard Reference Material 484 is an artifact for calibrating the magnification scale of a Scanning Electron Microscope (SEM) within the range of 1000 × to 20000 ×. Seven issues, SRM-484, and SRM-484a to SRM-484f, have been certified between 1977 and 1992. This publication documents the instrumenta...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1994
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8345241/ https://www.ncbi.nlm.nih.gov/pubmed/37404711 http://dx.doi.org/10.6028/jres.099.015 |