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Product Inspection Methodology via Deep Learning: An Overview

In this study, we present a framework for product quality inspection based on deep learning techniques. First, we categorize several deep learning models that can be applied to product inspection systems. In addition, we explain the steps for building a deep-learning-based inspection system in detai...

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Detalles Bibliográficos
Autores principales: Kim, Tae-Hyun, Kim, Hye-Rin, Cho, Yeong-Jun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8346960/
https://www.ncbi.nlm.nih.gov/pubmed/34372276
http://dx.doi.org/10.3390/s21155039
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author Kim, Tae-Hyun
Kim, Hye-Rin
Cho, Yeong-Jun
author_facet Kim, Tae-Hyun
Kim, Hye-Rin
Cho, Yeong-Jun
author_sort Kim, Tae-Hyun
collection PubMed
description In this study, we present a framework for product quality inspection based on deep learning techniques. First, we categorize several deep learning models that can be applied to product inspection systems. In addition, we explain the steps for building a deep-learning-based inspection system in detail. Second, we address connection schemes that efficiently link deep learning models to product inspection systems. Finally, we propose an effective method that can maintain and enhance a product inspection system according to improvement goals of the existing product inspection systems. The proposed system is observed to possess good system maintenance and stability owing to the proposed methods. All the proposed methods are integrated into a unified framework and we provide detailed explanations of each proposed method. In order to verify the effectiveness of the proposed system, we compare and analyze the performance of the methods in various test scenarios. We expect that our study will provide useful guidelines to readers who desire to implement deep-learning-based systems for product inspection.
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spelling pubmed-83469602021-08-08 Product Inspection Methodology via Deep Learning: An Overview Kim, Tae-Hyun Kim, Hye-Rin Cho, Yeong-Jun Sensors (Basel) Article In this study, we present a framework for product quality inspection based on deep learning techniques. First, we categorize several deep learning models that can be applied to product inspection systems. In addition, we explain the steps for building a deep-learning-based inspection system in detail. Second, we address connection schemes that efficiently link deep learning models to product inspection systems. Finally, we propose an effective method that can maintain and enhance a product inspection system according to improvement goals of the existing product inspection systems. The proposed system is observed to possess good system maintenance and stability owing to the proposed methods. All the proposed methods are integrated into a unified framework and we provide detailed explanations of each proposed method. In order to verify the effectiveness of the proposed system, we compare and analyze the performance of the methods in various test scenarios. We expect that our study will provide useful guidelines to readers who desire to implement deep-learning-based systems for product inspection. MDPI 2021-07-25 /pmc/articles/PMC8346960/ /pubmed/34372276 http://dx.doi.org/10.3390/s21155039 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Kim, Tae-Hyun
Kim, Hye-Rin
Cho, Yeong-Jun
Product Inspection Methodology via Deep Learning: An Overview
title Product Inspection Methodology via Deep Learning: An Overview
title_full Product Inspection Methodology via Deep Learning: An Overview
title_fullStr Product Inspection Methodology via Deep Learning: An Overview
title_full_unstemmed Product Inspection Methodology via Deep Learning: An Overview
title_short Product Inspection Methodology via Deep Learning: An Overview
title_sort product inspection methodology via deep learning: an overview
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8346960/
https://www.ncbi.nlm.nih.gov/pubmed/34372276
http://dx.doi.org/10.3390/s21155039
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