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Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment

This protocol enables correlative light and electron microscopy (CLEM) imaging of cell surface features without using dedicated equipment. Cells are cultured and fixed on transparent substrates for confocal microscopy imaging. No conductive coating is employed in the scanning electron microscopy wor...

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Detalles Bibliográficos
Autores principales: Casares-Arias, Javier, Alonso, Miguel A., San Paulo, Álvaro, González, María Ujué
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8361273/
https://www.ncbi.nlm.nih.gov/pubmed/34409307
http://dx.doi.org/10.1016/j.xpro.2021.100727
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author Casares-Arias, Javier
Alonso, Miguel A.
San Paulo, Álvaro
González, María Ujué
author_facet Casares-Arias, Javier
Alonso, Miguel A.
San Paulo, Álvaro
González, María Ujué
author_sort Casares-Arias, Javier
collection PubMed
description This protocol enables correlative light and electron microscopy (CLEM) imaging of cell surface features without using dedicated equipment. Cells are cultured and fixed on transparent substrates for confocal microscopy imaging. No conductive coating is employed in the scanning electron microscopy workflow, providing a clean cell surface observation, with fiducial markers assisting alignment of optical and topographical images. This protocol describes CLEM imaging for midbody remnants in MDCK cells but can also be applied to different cell types and surface features. For complete details on the use and execution of this protocol, please refer to Casares-Arias et al. (2020).
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spelling pubmed-83612732021-08-17 Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment Casares-Arias, Javier Alonso, Miguel A. San Paulo, Álvaro González, María Ujué STAR Protoc Protocol This protocol enables correlative light and electron microscopy (CLEM) imaging of cell surface features without using dedicated equipment. Cells are cultured and fixed on transparent substrates for confocal microscopy imaging. No conductive coating is employed in the scanning electron microscopy workflow, providing a clean cell surface observation, with fiducial markers assisting alignment of optical and topographical images. This protocol describes CLEM imaging for midbody remnants in MDCK cells but can also be applied to different cell types and surface features. For complete details on the use and execution of this protocol, please refer to Casares-Arias et al. (2020). Elsevier 2021-08-09 /pmc/articles/PMC8361273/ /pubmed/34409307 http://dx.doi.org/10.1016/j.xpro.2021.100727 Text en © 2021 The Author(s) https://creativecommons.org/licenses/by/4.0/This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Protocol
Casares-Arias, Javier
Alonso, Miguel A.
San Paulo, Álvaro
González, María Ujué
Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment
title Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment
title_full Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment
title_fullStr Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment
title_full_unstemmed Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment
title_short Correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment
title_sort correlative confocal and scanning electron microscopy of cultured cells without using dedicated equipment
topic Protocol
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8361273/
https://www.ncbi.nlm.nih.gov/pubmed/34409307
http://dx.doi.org/10.1016/j.xpro.2021.100727
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